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INTERFEROMETR FIZEAU

 

 

 

  SR HR HRx SR HR HRx SR HR HRx HR
S50 S50 S50 S100 S100 S100 S150 S150 S150 S300
Output Diameter 51 mm 51 mm 51 mm 102 mm 102 mm 102 mm 153 mm 153 mm 153 mm 304 mm
Image Resolution 100 μm 50 μm  35 μm 200 μm 100 μm   70 μm 300 μm 150 μm  105 μm 300 μm
Image Distortion <0.1% <0.06% <0.06% <0.1% <0.06% <0.06% <0.1% <0.06% <0.06% <0.06%
Fringe Resolution (fr/aperture) >300 >600 >600 >300 >600 >600 >300 >600 >600 >500

Retrace Error3

@ fringes

< λ/10

@256

< λ/10 4

@512

< λ/15  4

@512

< λ/10

@256

< λ/10 4

@512

< λ/15  4

@512

< λ/10

@256

< λ/10 4

@512

< λ/15 4

@512

 < λ/15  4

  @200 

RMS Simple Repeatability1 <0.6 nm RMS 1σ – with NO averaging         
RMS Wavefront Repeatability2 <0.6 nm RMS 1σ – with NO averaging         
Measurable Part Reflectivity 0.1%to 40% direct and >41% with attenuation filter or coatings 0.5 - 100% 

 

1 RMS Simple Repeatability is defined as 2X the s tandard deviation of the RMS for 36 sequential measurements (0 averages ) of a short plano cavity

2 RMS Wavefront Repeatability is defined as the mean RMS difference between a synthetic reference (defined as the a verage of a ll 36 sequential measurements ) and each measurement plus 2X the standard deviation

3 Retrace Error is defined as the PV residual error between a nulled measurement (the reference), subtracted from a measurement with 500 fringes of tilt, and expres sed by the first 36 Zernike polynomials

4 λ/20 optionally available

 

S300 HR

 

4-Megapixel @180 Hz diffraction limited imaging

20X virtual zoom beats a 1-Megapixel 4″ Zoom Fizeau resolution!

 

Pobierz ulotkę S300 HR

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