Wzorce odbicia dyfuzyjnego (PTFE lub Spectralon) i zwierciadlanego (także z certfikatem NIST).


 Uwaga! Oprócz niżej wymienionych wzorców sprzedajemy też pozostałe wzorce z oferty firmy LABSPHERE.


Diffuse Standard for Reflectance Measurements

Ocean Optics offers two types of diffuse reflectance standards. The WS-1 uses a PTFE optical diffuser, a Lambertian material distinguished by its white matte finish and reflectivity >98% from 250-1500 nm and >95% from 250-2200 nm.

For field work or unclean environments, the WS-1-SL can be a good option. Its Spectralon diffusing material can be smoothed, flattened and cleaned if it gets pitted or dirty. Reflectivity is 99% from 400-1500 nm and >96% (250-2000 nm).


  • Diffusing materials – choose from PTFE or Spectralon standards
  • High reflectivity over broad range – >95% reflectivity from 250-2200 nm
  • More options – additional Spectralon reflectance standards and targets also available


Engineering Specifications WS-1 WS-1-SL
Dimensions: 38 mm diameter (housing) 32 mm OD, 10 mm thick (tile)
Weight: 30 g 30 g
Spectral range: 250-2000 nm 250-2500 nm
Diffusing material: PTFE Spectralon
Housing material: Aluminum Delrin
Reflectivity: >98% (250-1500 nm)>95% (250-2200 nm) 99% (400-1500 nm)>96% (250-2000 nm)


STAN Series Reflectance Standards

Ideal for Specular Reflectance Measurements

Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings.

The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.

For measuring surfaces with low specular reflectivity, we recommend the STAN-SSL, which has ~4% reflectivity from 200-2500 nm. Add a STAN-HOLDER to keep your standards in place and to protect their coatings.

  • Specular reflectance – options for high and low specular reflectivity
  • Calibrated standard – NIST-traceable version available
  • Convenient holder – optional accessory holds standard in place


Engineering Specifications STAN-SSH STAN-SSH-NIST STAN-SSL
Dimensions (substrate): 31.75 mm OD x 6.35 mm height 31.75 mm OD x 6.35 mm height 31.75 mm OD x 6.35 mm height
Dimensions (housing): 38 mm OD x 19 mm height 38 mm OD x 19 mm height 38 mm OD x 19 mm height
Weight: 40 g 40 g 40 g
Reflectance material: Al mirror on fused silica substrate Al mirror on fused silica substrate Schott ND9 glass
Reflectivity: ~87%-93% (200-1000 nm) ~87%-93% (250-1000 nm) ~5% (200-950 nm)
~93%-98% (1000-2500 nm) ~93%-98% (1000-2500 nm) ~4% (950-2500 nm)